JOT M10 Test Concept

Maximal test capacity, minimal footprint. True scalability by application-specific test boxes, handlers and racks. Just pick the most suitable modules.

Scalable, modular and cost-effective solution for PCB-level functional and ICT testing, flashing and RF-tuning of smart devices and industrial electronics. The M10 consists of test boxes, handlers, and racks. The modular system architecture enables easy adaptation to production volume variations during a product's life cycle and also between the production lines and factories.

The M10 concept is application-independent and still application-oriented. Each test box has a dedicated area for application-specific electronics and product-specific fixturing. The very same application-specific test box can be used off-line e.g. in R&D or the pre-production phase and later taken to volume production simply by integrating boxes to the M10 handler without any modifications to the boxes, securing efficient and swift production ramp ups.

The M10 handling process is defined by SW recipes. A recipe is a kind of map for the device to be tested. This kind of architecture gives high flexibility over the product's lifetime and ensures system reusability with next-generation products.